At SuCL we offer a comprehensive range of high-precision techniques for surface analysis, nanoanalytics, material testing, and thin-film characterization. Our laboratory is equipped with state-of-the-art tools including atomic force microscopy (AFM), scanning electron microscopy (SEM), FTIR and UV-Vis spectroscopy, ellipsometry, tribometry, and advanced electrical measurement systems.

Whether you work in research, development, or quality assurance, our analytical capabilities provide detailed insights into surface topography, composition, layer thickness, wettability, mechanical properties, and more. This enables reliable material assessment for applications in microtechnology, optoelectronics, medical devices, sensors, and photonics.

All methods and instruments are available as part of our analytical services, research collaborations, or for method development projects.