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Surface Characterization Lab

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Methods

Methods

Topography

Atomic Force Microscopy (AFM)
Optical Profilometry
Scanning Electron Microscopy: SEM
Surface Profilometry

Electrical

Enhanced Atomic Force Microscopy (KPFM, PFM)
Impedance Spectroscopy
4 Point Probe Measurement

Mechanical

Enhanced Atomic Force Microscopy
Micro Scratch Testing
Tensile Testing
Microindentation
Pin-on-Disk / Ball-on-Disk Tribometer

Chemical

X-Ray Photoelectron Spectroscopy (XPS) and UV Photoelectron Spectroscopy
FTIR Spectroscopy
SEM with Energy Dispersive X-Ray Spectroscopy Detector (EDS)
Fluorescence Microscopy

Cross section

Ultramicrotomy
Waveguide Polishing
Atomic Force Microscopy (AFM)
Embedding and Polishing
Scanning Electron Microscopy (SEM)

Optical

Ellipsometry
Integrating Sphere, Luminance and Colorimetry Camera
Fluorescence Microscopy
3D Surface Scanning
Array Spectroradiometry
Goniophotometry, Spectrometry
Waveguide Polishing

Wetting

Contact Angle Measurement

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JOANNEUM-RESEARCH-Logo

Shaping the future, together

JOANNEUM RESEARCH provides innovation and technology services in the field of applied research. As a research company working on behalf of various federal provinces and regions in Austria, our expertise shapes the development of our modern society and economy – sustainably, and always with a focus on people. As a multidisciplinary team working in a flexible set-up that fosters innovation, we always live up to the highest social and scientific standards.

CONTACT JOANNEUM RESEARCH Forschungsgesellschaft mbH

MATERIALS
Institute for Sensors, Photonics and Manufacturing Technologies
Franz-Pichler-Straße 30,
A-8160 Weiz
+43 316 876-3000
sucl@joanneum.at

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